CCD or CMOS? How Imaging Sensor Properties Affect Pixel-Level Measurement of Displays
Imaging systems are highly efficient visual inspection tools, enabling contextual analysis of the complete area of a display, including deviations in luminance, color, and other characteristics. The process of converting light into digital input to create an image, however, is not precisely one-to-one. Imaging sensor types (CCD and CMOS) accomplish this conversion process in different ways, each with distinct benefits and limitations. Understanding sensor properties is critical for choosing a system that optimizes display measurement data and reduces variability. This is even more important when evaluating the extremely limited data-sampling area of a single display pixel—the key to quality in today’s high-resolution, emissive displays from OLEDs to microLEDs.
Hosted by Shannon Roberts, Product Manager at Radiant Vision Systems, this webinar presents the impact of imaging system specifications on measurement performance in display metrology. Shannon presents measurement examples that compare sensor type (CCD versus CMOS), pixel size, and signal-to-noise ratio (SNR), and the effect of these properties on the accuracy and repeatability of data for pixel-level display measurement. Topics include:
- Pixel-level measurement challenges
- The importance of measurement repeatability and precision
- The impact of sensor properties (resolution, SNR, well capacity, and photon transfer curve)
- A comparison of today’s CCD and CMOS sensors for pixel-level display measurement