Radiant Source Model and BSDF Material Scatter Characterization

Webinar

Learn the importance of Radiant Source Models for characterizing luminance and geometry of light rays at each view angle of a light source. Light sources can be represented through either Near-Field or Far-Field data, with Near-Field data offering significant advantages to understanding how light arrays originate from multiple points in a light source, thereby detecting source defects more precisely. Radiant ProMetric® Software generates source models using Radiant Source Model™ measurements, which include both Near- and Far-Field data to most thoroughly characterize a light source for precise engineering and development purposes.

In this webinar, you will learn about:

  • Various Source Models Available for Light Source Measurement (such as IES, ELUMDAT, and Radiant Source Model™)
  • What Their Significance is for BSDF (Bidirectional Scattering Distribution Function) Material Scatter Characterization
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