SPIE AR/VR/MR Conference

Location: 
The Moscone Center, San Francisco, CA
Event Date:  
Sunday, February 2, 2020

Event Time:  
10:30am - 11:45am  PST

Radiant Vision Systems will lead a technical talk as part of the first day of the SPIE AR/VR/MR Conference taking place Feb. 2-4, 2020, at The Moscone Center in San Francisco, CA (one of a number of events taking place during SPIE Photonics West). Eric Eisenberg, Application Software Manager at Radiant, presents the company's technical paper during Session 2C on Feb. 2 from 11:00-11:20 AM. The paper describes the unique visual requirements of augmented reality displays and demands on photometric measurement technology for accurately qualifying the visual performance of these systems. 

Measuring and qualifying optical performance of AR/VR/MR device displays and addressing the unique visual requirements of transparent AR displays
Paper 11310-25
Author(s): Eric Eisenberg, Jens Jensen, Radiant Vision Systems, LLC (United States)

Abstract:
Ensuring the quality and accuracy of AR/VR/MR headset displays requires precise measurement and qualification. Because these HMDs are viewed close to the eye, even minor defects and irregularities can be noticed by a human wearer, potentially interfering with functionality and user experience. This paper provides a brief overview of AR/VR/MR display metrology and focuses on the unique requirements of testing AR and MR displays, given their narrow FOV and transparent display substrates. Topics covered: optical configurations and performance parameters; addressing measurement challenges, and recent research into testing new types AR optical architectures to match the human visual experience.